Electrical circuit conductor inspection

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition

Reexamination Certificate

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Details

C356S237100

Reexamination Certificate

active

06870611

ABSTRACT:
A first inspection functionality is provided to obtain information about a first attribute at a conductor location on an electrical circuit. A second inspection functionality is provided to obtain information about a second attribute at the conductor location. A combination of first attribute information and second attribute information is analyzed to determine an inspection attribute of the conductor at the conductor location. Attribute information may relate to one or more of: reflectance, fluorescence or height.

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Catelogue, “Laservia Inspection: A New Blaser Option for Microvia Inspection”, Orbotech Ltd., Yavne, Israel, 1999, 4 pages.

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