Method for testing semiconductor circuit devices

Details Method for testing semiconductor circuit devices Method for testing semiconductor circuit devices

2005-04-05

2005-04-05

Zarneke, David (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

06876217

ABSTRACT:
To be able to test a plurality of identical semiconductor circuit devices in a particularly rapid yet reliable manner, a test method includes carrying out the tests in parallel and substantially simultaneously on the plurality of semiconductor circuit devices and driver lines—used in the process—of a test device to the semiconductor circuit devices simultaneously and jointly for all the semiconductor circuit devices. In such a case, test results are read from a plurality of input/output channels in compressed form. Furthermore, as an alternative or in addition thereto, the semiconductor circuit devices to be tested are disposed and connected up in at least one stack.

REFERENCES:
patent: 5794175 (1998-08-01), Conner
patent: 6233184 (2001-05-01), Barth et al.
patent: 6470485 (2002-10-01), Cote et al.
patent: 6661718 (2003-12-01), Ohlhoff et al.

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