Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2005-09-27
2005-09-27
Nguyen, Vincent Q. (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S678000, C073S724000
Reexamination Certificate
active
06949937
ABSTRACT:
A circuit and method are given, which realizes a stable yet sensitive differential capacitance measuring device with good RF-suppression and with very acceptable noise features for use in capacitive sensor evaluation systems. By evaluating the difference of capacitor values only—with the help of a switched capacitor front-end—large spreads of transducer capacitor values are tolerable. Furthermore a mode of operation can be set up, where no essential galvanic connection between sensor input and the active read-out input at any given time is existing. The solution found exhibits a highly symmetrical construction. Using the intrinsic advantages of that solution the circuit of the invention is manufactured as an integrated circuit with standard CMOS technology at low cost.
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Ackerman Stephen B.
Dialog Semiconductor GmbH
Nguyen Hoai-An D.
Nguyen Vincent Q.
Saile George O.
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