Method and apparatus for optimizing the accuracy of an...

Details Method and apparatus for optimizing the accuracy of an... Method and apparatus for optimizing the accuracy of an...

2005-05-24

2005-05-24

Deb, Anjan K. (Department: 2858)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

C324S762010

Reexamination Certificate

active

06897662

ABSTRACT:
The present invention provides an apparatus and method for improving the accuracy of circuits. The apparatus includes a replicate circuit and a trim determination circuit. The trim determination circuit includes a measurable circuit element and determines the state of the measurable element. The replicate circuit includes a replicate circuit element which has similar electrical characteristics as the measurable element, and is configured to aid in determining an adjustable test current. The trim determination circuit generates a test current which is proportional to the adjustable test current. The test current is passed through the measurable element such that a first voltage drop occurs across the measurable element. A measured current is generated at a current level dictated by the voltage drop across the measurable element, such that the state of the measurable element is determined by the difference between the measured current and a scaled reference current.

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patent: 20040227539 (2004-11-01), Thiery

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