Differential time-to-threshold A/D conversion in digital...

Details Differential time-to-threshold A/D conversion in digital... Differential time-to-threshold A/D conversion in digital...

2005-03-29

2005-03-29

Tokar, Michael (Department: 2819)

Coded data generation or conversion

Analog to or from digital conversion

Analog to digital conversion

C341S166000

Reexamination Certificate

active

06873282

ABSTRACT:
Differential measurements allow correction of fixed-pattern noise errors in digital imaging arrays which use time-to-threshold A/D conversion techniques. Two time-to-threshold measurements are made with the same sensor and threshold-detecting circuitry. The measurements are made in quick succession so that the amount of incident energy is substantially unchanged. However, the two measurements use differing initial sensor output levels or threshold levels. The difference between the two measurements then reflects the time required for each sensor output signal to change by an amount equal to the difference between the initial sensor output values or the threshold values. Repeatable noise terms are cancelled in the computed difference measurement.

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