System and method for testing semiconductor devices

Details System and method for testing semiconductor devices System and method for testing semiconductor devices

2005-05-17

2005-05-17

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S1540PB

Reexamination Certificate

active

06894523

ABSTRACT:
The invention(s) relates to semiconductor test system and method that isolates and counteracts forces that bend test equipment resulting in improved manufacturing yield and throughput. The system includes a force retainer fixedly mounted on a material handler and a force locator positioned between the force retainer and a circuit board. Together, the force retainer and locator prevent the circuit board from bending. Other embodiments are illustrated and described.

REFERENCES:
patent: 5821764 (1998-10-01), Slocum et al.
patent: 6064215 (2000-05-01), Kister
patent: 6166553 (2000-12-01), Sinsheimer
patent: 6292005 (2001-09-01), Suga
patent: 6420885 (2002-07-01), Fredrickson

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