Method for correcting measurement error, method of...

Details Method for correcting measurement error, method of... Method for correcting measurement error, method of...

2005-04-05

2005-04-05

Nghiem, Michael (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

Reexamination Certificate

active

06876935

ABSTRACT:
The impedance of a correction-data obtaining sample is measured by a standard measuring device and an actual measuring device so as to obtain an interrelated expression of the measurement results generated by the standard and actual measuring devices. The impedance of an electronic component measured by the actual measuring device is substituted into the interrelated expression and the expression is calculated. Accordingly, the impedance of the electronic component is corrected to the impedance which would be obtained from the standard measuring device.

REFERENCES:
patent: 5175492 (1992-12-01), Wong et al.
patent: 5784299 (1998-07-01), Evers et al.
patent: 6697749 (2004-02-01), Kamitani
patent: 08-015348 (1996-01-01), None
HP 4284A Precision LCR Meter Instruction Manual, pp. 6-14 to 6-19 (Dec. 1966).

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