Method of producing analytical curve

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356 39, 364496, 36447401, G06F 1542

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active

049597965

ABSTRACT:
A method of producing an analytical curve for an analyzing apparatus which provides an analysis result on the basis of the analytical curve in response to a measurement value obtained by photoelectrically measuring light intensity reflected from a slide to be analyzed. A plurality of reference slides are measured by first analyzing apparatus which has a predetermined analytical curve, thereby obtaining a plurality of first measurement values and providing a plurality of first analysis results. The plurality of reference slides are further measured by second analyzing apparatus, thereby obtaining a plurality of second measurement values. Analytical curve for the second analyzing apparatus for produced on the basis of a relation between the first measurement values and the second measurement values so that a plurality of second analysis results correspond to the plurality of first analysis results.

REFERENCES:
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patent: 4373818 (1983-02-01), Yamamoto et al.
patent: 4627014 (1986-12-01), Lo et al.
patent: 4706207 (1987-11-01), Hennessy et al.
patent: 4744657 (1988-05-01), Aralis et al.
patent: 4832488 (1989-05-01), Hirai et al.

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