Analog filter with built-in self test

Details Analog filter with built-in self test Analog filter with built-in self test

2002-01-30

2004-08-17

Decady, Albert (Department: 2133)

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

Analysis of complex waves

C324S076450

Reexamination Certificate

active

06777921

ABSTRACT:

BACKGROUND
This disclosure relates to analog filters with a built-in self-test.
Analog filters are commonly used in telecommunications and other applications. Such filters may form part of an integrated circuit. To assure that the filters meet design specifications, the integrated circuits may be subjected to testing during various stages of development and manufacturing. As a result of the increased complexity of integrated circuits and reduced access to internal circuit nodes, testing the filters in such integrated circuits occasionally results in significant delays during the development, production and maintenance of the integrated circuits.


REFERENCES:
patent: 5923676 (1999-07-01), Sunter et al.
patent: 6373416 (2002-04-01), McGrath
patent: 6408412 (2002-06-01), Rajsuman
patent: 6418547 (2002-07-01), Merritt
patent: 6448754 (2002-09-01), Ihs et al.

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