Method and apparatus for detecting prospective abnormal patterns

Image analysis – Applications – Biomedical applications

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

382260, G06K 900

Patent

active

059405279

ABSTRACT:
A value of the degree of centralization of gradient vectors, which has been calculated from an image signal, is compared with a threshold value, and a region of a prospective abnormal pattern is thereby determined. A picture element corresponding to a position, at which the center of gravity on the region of the prospective abnormal pattern is located, is taken as the picture element of interest, and a picture element corresponding to an end point that is associated with a mean value of index values for each radial direction line in iris filter processing, which mean value takes the maximum value, is thereby specified as a marginal point of the region of the prospective abnormal pattern in the direction along which the radial direction line extends. The thus set marginal points are connected by predetermined lines, and the region surrounded by the connecting lines is extracted as the prospective abnormal pattern. The contour shape of a prospective abnormal pattern having a shape with a special image density distribution is detected accurately.

REFERENCES:
patent: 4952802 (1990-08-01), Adachi
patent: 5212637 (1993-05-01), Saxena
patent: 5231679 (1993-07-01), Matsuura et al.
patent: 5267328 (1993-11-01), Gouge
patent: 5448654 (1995-09-01), Katayama et al.
patent: 5481623 (1996-01-01), Hara
patent: 5572565 (1996-11-01), Abdel-Motaleb
patent: 5768406 (1998-06-01), Abdel-Mottaleb
patent: 5784482 (1998-07-01), Nakajima

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus for detecting prospective abnormal patterns does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for detecting prospective abnormal patterns, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for detecting prospective abnormal patterns will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-322943

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.