System for testing of digital integrated circuits

Details System for testing of digital integrated circuits System for testing of digital integrated circuits

1993-10-15

1996-01-16

Voeltz, Emanuel T.

Excavating

371 225, G06F 11263

Patent

active

054854717

ABSTRACT:
In integrated circuit testing which involves partitioning of tailored test vectors into subsets and filling of the subsets with similar vectors starting with vectors close to the initially selected vector and continuing to add vectors farther away until an optimal number of vectors are in the subset, a system is provided for selecting a number of test vectors to go into a subset by using a unique "distance" measure to measure how far away the candidate vector is from what is already in the subset. Distance determination involves comparing the candidate vector with the weights generated from randomization of the previous vectors in the subset. Having provided a unique distance or "closeness" measure for each candidate vector, the distance of a number of candidate vectors is ascertained. The one with the smallest distance from those vectors already in the subset is selected for determination as to whether its inclusion in the subset results in more rapid and accurate fault detection. This determination is made based on a prediction algorithm which includes calculation of the mathematical expectation of the number of tailored vectors not appearing in a weighted random sequence.

REFERENCES:
patent: 4688223 (1987-08-01), Motiha et al.
patent: 5027353 (1991-06-01), Jarwala et al.
patent: 5187712 (1993-02-01), Malleo-Roach et al.
patent: 5323400 (1994-06-01), Agarwal et al.
patent: 5414716 (1995-05-01), Bershteyn

Affiliated with

Also associated with

Rating

System for testing of digital integrated circuits does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with System for testing of digital integrated circuits, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System for testing of digital integrated circuits will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-314993