Process for forming a film on a substrate having a field...

Electric lamp or space discharge component or device manufacturi – Process – Electrode making

Reexamination Certificate

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C445S024000, C427S077000

Reexamination Certificate

active

06517405

ABSTRACT:

FIELD OF THE INVENTION
The present invention relates to a process for forming a film on a substrate having a field emitter by bias enhanced nucleation chemical vapor deposition.
DESCRIPTION OF THE RELATED ART
FIGS. 1A through 1C
illustrate a process flow for forming a diamond film on a silicon field emitter, which has characteristics of low work function, high chemical/physical stability, and high hardness. The diamond film is utilized for improving the performance of a silicon field emission device.
FIG. 1A
shows a silicon substrate
10
having a silicon tip as a field emitter
12
.
As shown in
FIGS. 1B through 1C
, a diamond thin film
20
is grown by microwave plasma chemical vapor deposition (MPCVD), electron cyclone resonance chemical vapor deposition (ECR-CVD), or laser ablation. Subsequently, a final diamond layer
30
depicted in
FIG. 1C
is formed.
However, it is difficult to etch a diamond layer with conventional semiconductor technology due to its high hardness and high chemical/physical stability. Therefore, conventional diamond layer formation methods cannot be used in field emission devices that contain conductive gate. electrodes.
SUMMARY OF THE INVENTION
In view of the above disadvantages, an object of the invention is to provide a process for forming a film on a substrate having a field emitter. Thus, a carbon-containing film such as diamond film can be selectively deposited on a silicon tip.
Another object of the invention is to maintain a high aseptic ratio of the diamond film.
Also, further another object of the invention is to form a field emitter having multiple-tips so as to improve performance of the field emission device.
The above objects are attained by providing a process for forming a film on a substrate having a (silicon) field emitter, said process comprising the steps of: (a) cleaning said substrate and said field emitter by hydrogen plasma to remove the impurities thereon; (b) forming a silicon carbide film over said field emitter; (c) applying a negative bias voltage of about 150 V to about 300 V to said substrate for increasing the nucleation sites of said silicon carbide film; and (d) stopping said negative bias voltage so as to grow a carbon-containing film from said silicon carbide film.
In an embodiment of said invention, the silicon carbide film in step (b) is formed by electron cyclone resonance chemical vapor deposition (ECR-CVD) using a mixture gas containing silicane and methane, wherein the process is performed at room temperature and with a microwave power of about 1000W.
The step (b) of the process of this invention can further comprise the step of applying a negative bias voltage of about 100 V to about 300 V to said substrate.
The carbon-containing film formed by the process of this invention can be a diamond film, diamond-like film, amorphous carbon film, or graphite-like film.


REFERENCES:
patent: 4958590 (1990-09-01), Goforth
patent: 5580380 (1996-12-01), Liu et al.
patent: 5602439 (1997-02-01), Valone
patent: 5702281 (1997-12-01), Huang et al.
patent: 5944573 (1999-08-01), Mearini et al.
patent: 6132278 (2000-10-01), Kang et al.

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