Machine vision method for the inspection of a material for...

Radiant energy – Photocells; circuits and apparatus – With circuit for evaluating a web – strand – strip – or sheet

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C356S430000, C382S141000, C348S125000, C348S364000

Reexamination Certificate

active

06531707

ABSTRACT:

BACKGROUND OF THE INVENTION
1. Field of Invention
This invention relates to inspection methods and systems for machine vision applications.
2. Description of Background Information
There are various techniques for inspecting various types of manufactured objects. In such inspections, a determination may be made as to whether the object has certain features—present before or after a given manufacturing step. For example, during manufacturing of continuous web products, such as paper, metals, plastic foils and non-woven materials, the visual quality of the product or product surface may be monitored.
An existing approach for inspection of such products is based on optical measurement using a light source or multiple light sources to illuminate a material to be inspected and a camera to sense visible characteristics of the material to be inspected, such as material integrity or grade of the material. In such systems, camera elements are typically exposed to light transmitted through the continuous web of material or reflected from the surface of the material. In some of these systems, a number of filters may be mechanically switched to adjust or control the exposure control of the camera, which are sometimes referred to as “filter flippers” or “light attenuators”.
Existing inspection approaches change the light source or control the light intensity by adjusting the output level in line scan cameras or the pulse duration in matrix cameras.
SUMMARY
An exemplary embodiment of the invention provides A machine vision method and system for inspecting a material. The system comprises a light source arranged to illuminate the material and an imaging device configured to acquire image data corresponding to at least one characteristic of the material while the material is being illuminated by the light source. An image processor is configured to normalize the image data and to control adjustment of an exposure control level for the imaging device based upon the normalized image data.
An exemplary method of implementing the machine vision system may include illuminating a material using a light source and obtaining image data corresponding to the material using an imaging device. The image data is normalized and the adjustment of an exposure control level of the imaging device is controlled based on the raw data.


REFERENCES:
patent: 4779002 (1988-10-01), Takagi et al.
patent: 5168365 (1992-12-01), Kawahara
patent: 5281798 (1994-01-01), Hamm et al.
patent: 5347118 (1994-09-01), Iwanaga
patent: 5473374 (1995-12-01), Shimizu et al.
patent: 5559555 (1996-09-01), Shimizu et al.
patent: 5677733 (1997-10-01), Yoshimura et al.
patent: 6195127 (2001-02-01), Sugimoto
patent: 6211505 (2001-04-01), Nagamatsu

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Machine vision method for the inspection of a material for... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Machine vision method for the inspection of a material for..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Machine vision method for the inspection of a material for... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3077279

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.