Testing center

Details Testing center Testing center

2001-09-12

2003-04-01

Brooks, Cathron C. (Department: 2913)

Design Patent

active

D0472397

CLAIM:
The ornamental design for a testing center, as shown and described.

REFERENCES:
patent: 3083417 (1963-04-01), Cook
patent: 3418765 (1968-12-01), Propst et al.
patent: D216025 (1969-11-01), Gianfagna
patent: 3778911 (1973-12-01), Woolman
patent: 3818609 (1974-06-01), Woolman
patent: 3869992 (1975-03-01), Kramer
patent: 4486180 (1984-12-01), Riley
patent: 4569163 (1986-02-01), Long
patent: 4831791 (1989-05-01), Ball
patent: 4974915 (1990-12-01), Bussard
patent: 5058331 (1991-10-01), Epps
patent: 5133935 (1992-07-01), Copelan
patent: 5141437 (1992-08-01), Fowlkes, Jr.
patent: 5176520 (1993-01-01), Hamilton
patent: 5294229 (1994-03-01), Hartzell et al.
patent: 5310349 (1994-05-01), Daniels et al.
patent: D359631 (1995-06-01), Bubb
patent: 5513994 (1996-05-01), Kershaw et al.
patent: 5565316 (1996-10-01), Kershaw et al.
patent: 5567164 (1996-10-01), Durkin et al.
patent: 5897325 (1999-04-01), Koby-Olson
patent: 5947747 (1999-09-01), Walker et al.
patent: 5957698 (1999-09-01), Dean et al.
patent: D423825 (2000-05-01), Alcala et al.
patent: 6122865 (2000-09-01), Branc et al.
patent: 6146148 (2000-11-01), Stuppy
patent: 6170200 (2001-01-01), Cornell et al.
ipem.org website pages, available at least as early as Jan. 30, 2001, 5 pages.

Affiliated with

Also associated with

Rating

Testing center does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Testing center, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Testing center will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3043738