Data processing: measuring – calibrating – or testing – Testing system – Including program set up
Reexamination Certificate
1998-10-05
2002-07-09
Wachsman, Hal (Department: 2857)
Data processing: measuring, calibrating, or testing
Testing system
Including program set up
C702S120000, C702S119000
Reexamination Certificate
active
06418391
ABSTRACT:
BACKGROUND OF THE INVENTION
The present invention relates to a testing system which tests a device under test by interconnecting a test controller and one or more test units, and its controlling method. In this specification, a device under test (DUT) means a device, system, equipment, or component of equipment to be tested by the testing system according to the present invention. The test includes various actions to be conducted for known test purposes such as manufacturing evaluation, quality control, correction, calibration, alignment, adjustment, performance evaluation, diagnostics, and product incoming inspection.
In addition, a “testing apparatus” used herein includes one or more electronic equipment such as a signal generator, modulator, demodulator, input/output device, amplifier, mixer, coder, decoder, oscilloscope, strain gauge, wattmeter, multimeter, attenuator, detector, spectrum analyzer, network analyzer, semiconductor test device, synthesizer, thermostat oven, or measuring device, or a passive or active device or instrument necessary for performing evaluation, test, calibration, repair, adjustment or the like for evaluating an electronic device.
A “test task” used herein includes a test item, a test condition, tradeoff of a test whether the test is conducted at a high speed or at a high accuracy, a test element, and a test. Here, the test item indicates an item for testing a DUT such as high harmonics measurement. A test condition described by taking the above-mentioned high harmonics measurement as an example consists of parameters of the test item such as a fundamental harmonic frequency and the order of high harmonics to be measured, and test parameters of test elements utilized in the test. In addition, a test result corresponding to the test item is data obtained by performing an operation corresponding to the test item on test data obtained from the test element. For example, when described by taking the above-mentioned high harmonics measurement as an example, a power ratio between the fundamental harmonic and the high harmonics is the test result corresponding to the test item.
Moreover, a “program element” used herein includes the test tasks mentioned above, and conditions for controlling the execution order of test tasks such as begin, end, pause, wait, wait for specifying a start time, a loop for combining them, and a condition loop.
In addition, a “memory” used herein includes a RAM, ROM and EPROM, a permanent record storage device such as a floppy disk, hard disk and CD-ROM, and any other storage means known in the art.
It is necessary to use a plurality of testing device such as a spectrum analyzer or network analyzer to test a personal handy phone system (PHS) or cellular system. In such testing environment, a user of the testing system is not skilled in all of testing devices.
A conventional testing system employs an approach for visualizing a test program to provide environment which allows a person unskilled in the testing device to use the test program. Visualization means a scheme which represents a program as a collection of pictographs called icons each of which is a program part performing acquisition of or operation on data, or display of a graph, and specifies an order of program execution by connecting displayed icons with use of a pointing device with a push button on a screen of a computer as the testing apparatus.
A user of the testing system selects these icons stored in a menu or a toolbox by pointing (pressing the push button of the pointing device, and releasing the push button without moving the pointing device) a desired one with the pointing device with a push button. Then, pointing is performed again on a window screen for programming to place the selected icon on the screen. Several predetermined connection points are set to each icon, and connection is attained by pointing a connection point of icon corresponding to a connection start and a connection point of icon corresponding to a connection end with the pointing device with the push button.
(a) Attaining Testing System Starting Operation from Selection of Purpose/goal
As described above, a programming method of a conventional testing system employs an approach to connect program parts which performs data acquisition, arithmetic operation or graph representation by pointing points predetermined for respective icons and connecting them. Such connection approach has a problem that the user cannot effectively use the system unless he/she thoroughly understands a function of each icon, and a function of each connection point. Therefore, the user of the testing system concentrates much effort on a programming method of “how to combine programming parts provided by the testing system,” rather than considering a method for evaluating a DUT.
In particular, when it is intended to conduct a proper test in environment where a DUT cannot be tested unless a plurality of testing devices are used, a testing system is required which allows the user to concentrate his/her attention on detailed evaluation of the DUT even if he/she does not fully understand the testing system.
If there is a testing system which the user can start operation by selecting an object or goal of the test, he/she can concentrate his/her attention of how the DUT is evaluated. Thus, it is desired to have a testing system which can be operated by selecting a purpose or goal of a test.
(b) Attaining Testing System on which High Speed Testing or Highly Accurate Testing can be Specified
In utilizing a testing device or testing system, it is necessary to alternatively select whether the test is conducted at a high speed or at a high accuracy. There is a tradeoff between higher testing speed and higher testing accuracy. That is, if the test is conducted at a high speed, test accuracy should be sacrificed. contrary, if the test is conducted at a high accuracy, it takes a longer period of time.
However, such tradeoff between high speed testing and high accuracy testing has not been clear in the conventional testing system. Therefore, the user cannot attain detailed setting corresponding to the tradeoff on “how to use the testing device” unless he/she conducts the test with several trials and errors. In addition, there is problem that even such trial and error testing cannot be conducted unless the user fully understands the hardware configuration of the testing device and corresponding test parameters.
Thus, it is also desired to have a testing system which allows it to easily specify the tradeoff of high speed/high accuracy testing even if the user does not fully understand the detailed internal configuration of the testing system or device and the test parameters.
(c) Attaining Testing System in which, when Certain Coordinates are Specified on a Graph Representation as a Test Result, a Service is Started in Accordance with the Specified Region
It is requested for the testing system to represent test data of a DUT in a graph, which allows it to obtain, for example, a power value of unexpected spurious fast and at a high accuracy. However, for example, if it is intended to obtain a power value of spurious with the conventional testing system, it is necessary to perform programming and operation again such as (1) terminating the test, (2) building a program for adding test data, and (3) conducting the test again to find the power value. In this case, if the spurious from which the power is determined is a part of test data, it is necessary to locate array data in the corresponding test data from the positional coordinates of spurious on the graph representation, and to add a program which adds the located array data. As such, the conventional testing system requires much effort only even in finding the power value of spurious on the graph representation.
Thus, it is convenient if there is a testing system in which, when certain coordinates are specified on a graph representation as a test result, a service is started in accordance with the specified region.
(d) Attaining Testing System in which a New Test Parameter for a T
Miyajima Jun
Umezu Satoshi
Yamaguchi Takahiro
Advantest Corporation
Dellett and Walters
Wachsman Hal
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