Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Reexamination Certificate
1999-08-06
2002-08-13
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Temperature measuring system
C374S187000
Reexamination Certificate
active
06434504
ABSTRACT:
BACKGROUND OF THE INVENTION
The present invention relates to equipment of the type used in the process control industry. More specifically, the invention relates to diagnostics for process control device in which the diagnostics is a function of a resistance.
Process control devices are used to monitor process variables and control industrial processes. For example, a process control transmitter might monitor temperature and transmit such information back to a control room. Furthermore, a process controller such as a valve controller is used to control the process.
As sensors, control elements or other components, are subjected to harsh environmental conditions, the accuracy of the system tends to degrade. It is possible to compensate for this degradation by periodically recalibrating the device. Typically, this requires an operator to enter the field and perform a calibration process on-site on the device. This is both inconvenient and time consuming for the operator. Further, it is difficult to determine the condition of a device, prior to its ultimate failure.
It is also necessary for the device or their components to be periodically replaced as they age. However, it is difficult to determine precisely when such replacement is necessary. Therefore, components are typically replaced well before their failure or, in some cases, they may fail unexpectedly requiring an unscheduled system shutdown.
SUMMARY OF THE INVENTION
A device in a process control system includes an electrical element which has a resistance. self-heating circuitry coupled to the element provides a self-heating signal related to the resistance of the electrical element. Diagnostic circuitry provides an output as a function of the self-heating signal output, for example, a residual life estimate of the element or a calibration output.
REFERENCES:
patent: 3096434 (1963-07-01), King
patent: 3404264 (1968-10-01), Kugler
patent: 3468164 (1969-09-01), Sutherland
patent: 3590370 (1971-06-01), Fleischer
patent: 3688190 (1972-08-01), Blum
patent: 3691842 (1972-09-01), Akeley
patent: 3701280 (1972-10-01), Stroman
patent: 3973184 (1976-08-01), Raber
patent: RE29383 (1977-09-01), Gallatin et al.
patent: 4058975 (1977-11-01), Gilbert et al.
patent: 4099413 (1978-07-01), Ohte et al.
patent: 4102199 (1978-07-01), Talpouras
patent: 4122719 (1978-10-01), Carlson et al.
patent: 4249164 (1981-02-01), Tivy
patent: 4250490 (1981-02-01), Dahlke
patent: 4337516 (1982-06-01), Murphy et al.
patent: 4399824 (1983-08-01), Davidson
patent: 4517468 (1985-05-01), Kemper et al.
patent: 4528869 (1985-07-01), Ekstrom, Jr.
patent: 4530234 (1985-07-01), Cullick et al.
patent: 4571689 (1986-02-01), Hildebrand et al.
patent: 4635214 (1987-01-01), Kasai et al.
patent: 4642782 (1987-02-01), Mathur et al.
patent: 4644479 (1987-02-01), Kemper et al.
patent: 4649515 (1987-03-01), Thompson et al.
patent: 4707796 (1987-11-01), Calabro et al.
patent: 4736367 (1988-04-01), Wroblewski et al.
patent: 4777585 (1988-10-01), Kokawa et al.
patent: 4807151 (1989-02-01), Citron
patent: 4831564 (1989-05-01), Suga
patent: 4841286 (1989-06-01), Kummer
patent: 4873655 (1989-10-01), Kondraske
patent: 4907167 (1990-03-01), Skeirik
patent: 4924418 (1990-05-01), Backman et al.
patent: 4934196 (1990-06-01), Romano
patent: 4939753 (1990-07-01), Olson
patent: 4964125 (1990-10-01), Kim
patent: 4988990 (1991-01-01), Warrior
patent: 4992965 (1991-02-01), Holter et al.
patent: 5005142 (1991-04-01), Lipchak et al.
patent: 5019760 (1991-05-01), Chu et al.
patent: 5043862 (1991-08-01), Takahashi et al.
patent: 5053815 (1991-10-01), Wendell
patent: 5067099 (1991-11-01), McCown et al.
patent: 5081598 (1992-01-01), Bellows et al.
patent: 5089984 (1992-02-01), Struger et al.
patent: 5098197 (1992-03-01), Shepard et al.
patent: 5099436 (1992-03-01), McCown et al.
patent: 5103409 (1992-04-01), Shimizu et al.
patent: 5111531 (1992-05-01), Grayson et al.
patent: 5121467 (1992-06-01), Skeirik
patent: 5122794 (1992-06-01), Warrior
patent: 5122976 (1992-06-01), Bellows et al.
patent: 5130936 (1992-07-01), Sheppard et al.
patent: 5134574 (1992-07-01), Beaverstock et al.
patent: 5137370 (1992-08-01), McCullock et al.
patent: 5142612 (1992-08-01), Sheirik
patent: 5143452 (1992-09-01), Maxedon et al.
patent: 5148378 (1992-09-01), Shibayama et al.
patent: 5167009 (1992-11-01), Skeirik
patent: 5175678 (1992-12-01), Frerichs et al.
patent: 5193143 (1993-03-01), Kaemmerer et al.
patent: 5197114 (1993-03-01), Skeirik
patent: 5197328 (1993-03-01), Fitzgerald
patent: 5212765 (1993-05-01), Skeirik
patent: 5214582 (1993-05-01), Gray
patent: 5224203 (1993-06-01), Skeirik
patent: 5228780 (1993-07-01), Shepard et al.
patent: 5235527 (1993-08-01), Ogawa et al.
patent: 5265031 (1993-11-01), Malczewski
patent: 5265222 (1993-11-01), Nishiya et al.
patent: 5269311 (1993-12-01), Kirchner et al.
patent: 5274572 (1993-12-01), O'Neill et al.
patent: 5282131 (1994-01-01), Rudd et al.
patent: 5282261 (1994-01-01), Skeirik
patent: 5293585 (1994-03-01), Morita
patent: 5303181 (1994-04-01), Stockton
patent: 5305230 (1994-04-01), Matsumoto et al.
patent: 5311421 (1994-05-01), Nomura et al.
patent: 5317520 (1994-05-01), Castle
patent: 5327357 (1994-07-01), Feinstein et al.
patent: 5333240 (1994-07-01), Matsumoto et al.
patent: 5347843 (1994-09-01), Orr et al.
patent: 5349541 (1994-09-01), Alexandro, Jr. et al.
patent: 5357449 (1994-10-01), Oh
patent: 5361628 (1994-11-01), Marko et al.
patent: 5365423 (1994-11-01), Chand
patent: 5367612 (1994-11-01), Bozich et al.
patent: 5384699 (1995-01-01), Levy et al.
patent: 5386373 (1995-01-01), Keeler et al.
patent: 5394341 (1995-02-01), Kepner
patent: 5394543 (1995-02-01), Hill et al.
patent: 5404064 (1995-04-01), Mermelstein et al.
patent: 5408406 (1995-04-01), Mathur et al
patent: 5408586 (1995-04-01), Skeirik
patent: 5414645 (1995-05-01), Hirano
patent: 5419197 (1995-05-01), Ogi et al.
patent: 5430642 (1995-07-01), Nakajima et al
patent: 5440478 (1995-08-01), Fisher et al.
patent: 5442639 (1995-08-01), Crowder et al.
patent: 5467355 (1995-11-01), Umeda et al.
patent: 5469156 (1995-11-01), Kogura
patent: 5469735 (1995-11-01), Watanabe
patent: 5469749 (1995-11-01), Shimado et al.
patent: 5481199 (1996-01-01), Anderson et al.
patent: 5483387 (1996-01-01), Bauhahn et al.
patent: 5485753 (1996-01-01), Burns et al.
patent: 5486996 (1996-01-01), Samad et al.
patent: 5488697 (1996-01-01), Kaemmerer et al.
patent: 5489831 (1996-02-01), Harris
patent: 5495769 (1996-03-01), Borden et al.
patent: 5510779 (1996-04-01), Maltby et al.
patent: 5511004 (1996-04-01), Dubost et al.
patent: 5548528 (1996-08-01), Keeler et al.
patent: 5561599 (1996-10-01), Lu
patent: 5570300 (1996-10-01), Henry et al.
patent: 5572420 (1996-11-01), Lu
patent: 5573032 (1996-11-01), Lenz et al.
patent: 5598521 (1997-01-01), Kilgore et al.
patent: 5600148 (1997-02-01), Cole et al.
patent: 5623605 (1997-04-01), Keshav et al.
patent: 5637802 (1997-06-01), Frick et al.
patent: 5640491 (1997-06-01), Bhat et al.
patent: 5661668 (1997-08-01), Yemini et al.
patent: 5665899 (1997-09-01), Willcox
patent: 5669713 (1997-09-01), Schwartz et al.
patent: 5671335 (1997-09-01), Davis et al.
patent: 5675504 (1997-10-01), Serodes et al.
patent: 5675724 (1997-10-01), Beal et al.
patent: 5680109 (1997-10-01), Lowe et al.
patent: 5700090 (1997-12-01), Eryurek
patent: 5703575 (1997-12-01), Kirpatrick
patent: 5704011 (1997-12-01), Hansen et al.
patent: 5705978 (1998-01-01), Frick et al.
patent: 5708585 (1998-01-01), Kushion
patent: 5713668 (1998-02-01), Lunghofer et al.
patent: 5719378 (1998-02-01), Jackson, Jr. et al.
patent: 5741074 (1998-04-01), Wang et al.
patent: 5742845 (1998-04-01), Wagner
patent: 5746511 (1998-05-01), Eryurek et al.
patent: 5752008 (1998-05-01), Bowling
patent: 5764891 (1998-06-01), Warrior
patent: 5781878 (1998-07-01), Mizoguchi et al.
patent: 5801689 (1998-09-01), Huntsman
patent: 5805442 (1998-09-01), Crater et al.
patent: 5828567 (1998-10-01), Eryurek et al.
patent: 5829876 (1998-11-01), Schwartz et al.
patent: 5848383 (1998-12-01), Yuuns
patent: 5859964 (1999-01-01), Wang et al.
patent: 5876122 (1999-03-
Eryurek Evren
Esboldt Steven R.
Rome Gregory H.
Hoff Marc S.
Raymond Edward
Rosemount Inc.
Westman Champlin & Kelly P.A.
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