Coded data generation or conversion – Converter calibration or testing
Patent
1993-07-15
1995-02-14
Williams, Howard L.
Coded data generation or conversion
Converter calibration or testing
341141, 341155, 341172, H03M 110
Patent
active
053899261
ABSTRACT:
Disclosed herein is a microcomputer having a test circuit for an A/D converter of a C/R type. This converter includes a resistor circuit having a plurality of resistors connected in series between reference potential points to generate a changeable reference voltage and a capacitor circuit having a plurality of capacitors for storing electrical charges relative to an analog input voltage and to the changeable reference voltage, and the test circuit is coupled to the resistor circuit and the capacitor circuit and further to first and second terminals and activated in a test mode to transfer the changeable reference voltage to the first terminal and another reference voltage, which is produced outside the microcomputer, to the capacitor circuit.
REFERENCES:
patent: 4517549 (1985-05-01), Tsukakoshi
patent: 4599604 (1986-07-01), McKenzie et al.
patent: 4611195 (1986-09-01), Shosaku
patent: 4908620 (1990-03-01), Fujisawa et al.
patent: 5016014 (1991-05-01), Bitting
patent: 5175547 (1992-12-01), Lyon et al.
patent: 5185607 (1992-12-01), Lyon et al.
NEC Corporation
Williams Howard L.
LandOfFree
Microcomputer having test circuit for A/D converter does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Microcomputer having test circuit for A/D converter, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Microcomputer having test circuit for A/D converter will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-290434