Ramp gate erase for dual bit flash memory

Static information storage and retrieval – Floating gate – Particular biasing

Reexamination Certificate

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C365S185140, C365S185330

Reexamination Certificate

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07319615

ABSTRACT:
A method of erasing a block of flash memory cells by applying a ramped gate erase voltage to the block of memory cells. When an erase verify of the block of memory cells indicates that erasure has not been successfully completed another erase voltage with a greater absolute value than the initial erase voltage can be applied to the block of memory cells until erasure is complete.

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