X-ray inspection apparatus, X-ray inspection method, and...

Details X-ray inspection apparatus, X-ray inspection method, and... X-ray inspection apparatus, X-ray inspection method, and...

2008-07-29

2008-07-29

Yun, Jurie (Department: 2882)

X-ray or gamma ray systems or devices

Specific application

Absorption

C378S057000, C378S062000

Reexamination Certificate

active

07406152

ABSTRACT:
In an inspection of an object of inspection with use of X-rays, X-rays are output from an X-ray source disposed fixedly into a range of a predetermined solid angle and, while the object of inspection is moved along a plane within the output range of the X-rays, the X-rays are detected, in positions included in the solid angle and at a plurality of revolved points around an axis oriented vertical to the plane along which the object of inspection is moved, with its detecting surface tilted down toward the axis. Thus, the object can be inspected based on the detected X-rays.

REFERENCES:
patent: 6028910 (2000-02-01), Kirchner et al.
patent: 6335957 (2002-01-01), DiBianca
patent: 6763083 (2004-07-01), Fernandez
patent: 06-237077 (1994-08-01), None
patent: 11-174001 (1999-07-01), None
patent: 2000-356606 (2000-12-01), None
Communication dated Feb. 28, 2006, including European Search Report dated Feb. 17, 2006 (total 6 pages).

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