Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing
Reexamination Certificate
2008-03-11
2008-03-11
Lau, Tung S. (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Measured signal processing
Reexamination Certificate
active
07343267
ABSTRACT:
Embodiments of the present invention provide devices and techniques for detecting anomalies in monitored environments. In one embodiment of the invention, data may be acquired by monitoring an environmental variable. Based on the acquired data, statistics may be calculated which model the behavior of the environmental variable. Based on the calculated statistics, a long-term behavior and a short-term behavior of the statistics may also be calculated. A difference between the long-term statistics and the short-term statistics may then be calculated. If the difference between the long-term statistical behavior and short-term statistical behavior exceeds a dynamic or predefined threshold, an action may be taken.
REFERENCES:
patent: 2006/0045185 (2006-03-01), Kiryati et al.
Casler, et al., U.S. Appl. No. 11/265,512, “Using Statistics to Locate Signals in Noise”, filed Nov. 3, 2005.
Casler David C.
De Groen Piet C.
Mitchell Joan L.
International Business Machines - Corporation
Lau Tung S.
Mayo Foundation for Medical Education and Research
McGinnis William J.
Patterson & Sheridan LLP
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