Method and measurement program for burn-in test of two...

Details Method and measurement program for burn-in test of two... Method and measurement program for burn-in test of two...

2008-03-18

2008-03-18

Nguyen, Vinh P. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S754090, C324S762010

Reexamination Certificate

active

07345498

ABSTRACT:
A method for a burn-in test includes steps (a) and (b). In the step (a), an operation test of a first semiconductor device is executed through first probes provided on a probe card. In the step (b), a stress is applied to a second semiconductor device through second probes provided on the probe card while the operation test is executed.

REFERENCES:
patent: 4956605 (1990-09-01), Bickford et al.
patent: 5412314 (1995-05-01), Fukunaga et al.
patent: 6404219 (2002-06-01), Yamamoto
patent: 6630685 (2003-10-01), Lunde
patent: 6701474 (2004-03-01), Cooke et al.

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