Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate
2008-07-15
2008-07-15
Geisel, Kara E (Department: 2877)
Optics: measuring and testing
Inspection of flaws or impurities
Reexamination Certificate
active
07400389
ABSTRACT:
Methods and apparatuses for testing image sensors are disclosed. Desirable apparatuses of the present invention include image sensor testing devices comprising a digital light projection system capable of projecting static or dynamic images onto an image sensing device under test and an image sensor signal detection means for analyzing the output of said image sensing device under test. The digital light projection system comprises a light source, collimating optics, a digital micromirror device, and focusing optics. Other desirable methods and apparatuses of the present invention include image sensor testing devices employing a digital light projection system capable of simultaneously testing a plurality of image sensors. According to the present invention, the light source is calibrated and converted to a desired test image by the digital micromirror device. The test image is then focused onto an image sensor, the output of which is read by a detector and correlated with the input digital test image.
REFERENCES:
patent: 4648695 (1987-03-01), Mizutani et al.
patent: 5120960 (1992-06-01), Halvis
patent: 5448395 (1995-09-01), Lopez et al.
patent: 5467128 (1995-11-01), Yates et al.
patent: 5596185 (1997-01-01), Bross et al.
patent: 5694053 (1997-12-01), Smith
patent: 5803570 (1998-09-01), Chen et al.
patent: 6618076 (2003-09-01), Sukthankar et al.
patent: 7136157 (2006-11-01), Gomm et al.
patent: 2004/0108448 (2004-06-01), Bosser
patent: 1 303 147 (2003-04-01), None
patent: 03216566 (1991-09-01), None
Brian T. Teipen et al., Liquid-crystal-display projector-based modulation transfer function measurements of charge-coupled-device video camera systems, Applied Optics, Feb. 1, 2000, p. 515, vol. 39, No. 4.
Yokogawa, Image Sensor Test System TS6600, Online 2000, http://www.yokogawa.com/tsl/si/soc/6600/ts-soc6600-00len030521.htm (retrieved Dec. 3, 2004).
Michael R. Douglas, DMD reliability: a MEMS success story, SPIE Proceedings, Jan. 1, 2003, p. 1, vol. 4980.
Kauffmann, A; The Characteristics of CCD colour cameras and their measurement, Database Inspec, Online, The Institution of Electrical Engineers, Mar. 1988, pp. 72-82, vol. 32.
Bruce Jeff D.
Gomm Tyler J.
Dickstein & Shapiro LLP
Geisel Kara E
Micro)n Technology, Inc.
LandOfFree
Method and apparatus for testing image sensors does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for testing image sensors, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for testing image sensors will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2780348