Parallel, individually addressable probes for nanolithography

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Charge transfer device

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S444000, C257S234000, C257S431000

Reexamination Certificate

active

07402849

ABSTRACT:
A microfabricated probe array for nanolithography and process for designing and fabricating the probe array. The probe array consists of individual probes that can be moved independently using thermal bimetallic actuation or electrostatic actuation methods. The probe array can be used to produce traces of diffusively transferred chemicals on the substrate with sub-1 micrometer resolution, and can function as an arrayed scanning probe microscope for subsequent reading and variation of transferred patterns.

REFERENCES:
patent: 6642129 (2003-11-01), Liu et al.
patent: 6827979 (2004-12-01), Mirkin et al.
patent: 6862921 (2005-03-01), Chand et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Parallel, individually addressable probes for nanolithography does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Parallel, individually addressable probes for nanolithography, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Parallel, individually addressable probes for nanolithography will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2777199

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.