Image analysis – Applications – Manufacturing or product inspection
Patent
1997-09-26
2000-12-19
Bella, Matthew C.
Image analysis
Applications
Manufacturing or product inspection
382149, 382240, 382260, G06K 900
Patent
active
061636193
ABSTRACT:
An input digital image data is subject to a Wavelet transform on a screen on which the image is formed, an image energy quantity for a combined area of X-axis high pass information and Y-axis high pass information contained in the image data which results from the Wavelet transform is calculated, and it is determined if an object being examined is acceptable or faulty depending on whether the image energy quantity is below or above a given value.
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Jerome M. Shepin Embedded Image Coding Using Zerothie of Wavelet Coefficients IEEE vol. 41, Dec. 12, 1993.
Advantest Corporation
Bella Matthew C.
Chawan Sheela
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