Planar magnetoresistance thin film probe for magnetic field alig

Details Planar magnetoresistance thin film probe for magnetic field alig Planar magnetoresistance thin film probe for magnetic field alig

1975-11-17

1977-09-13

Krawczewicz, Stanley T.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

Frequency of cyclic current or voltage

340174EB, G01R 3302

Patent

active

040485579

ABSTRACT:
A probe for measuring the magnetic field in the plane of a magnetic device such as a magnetic bubble domain memory or the like. The probe includes a ferromagnetic, thin film element or pattern. A constant current source is connected to the ferromagnetic thin film element so that any resistance variation in the element can be sensed by measuring the voltage drop thereacross. When a magnetic field is applied in the plane of the probe, the domains in the ferromagnetic thin film element align along the direction of the magnetic field causing a magnetoresistance effect which the probe senses as a voltage change across the ferromagnetic thin film pattern. The planar magnetoresistance probe can be used to measure the amount of in-plane, d.c. field component of a perpendicularly applied bias field due to bias field misalignment. Moreover, the probe can be integrated within a magnetic device such as a magnetic bubble memory device.

REFERENCES:
patent: 3691540 (1972-09-01), Almasi et al.
patent: 3716781 (1973-02-01), Almasi et al.
patent: 3792451 (1974-02-01), Almasi et al.
patent: 3858189 (1974-12-01), Beausoleil
Chang et al., Bubble Domain Analog-to-Ditigal Converter, IBM Technical Disclosure Bulletin, Dec. 1971, pp. 2218, 2219.
Walker, Magneto-Resistive Detector, IBM Technical Disclosure Bulletin, July 1972, p. 500.
Almasi, Bubble Domain Propagation and Sensing, Proceedings of the IEEE, Apr. 1973, pp. 438-444.
Almasi et al., Magnetoresistive Detector for Bubble Domains, Journal of Applied Physics, Mar. 15, 1971, pp. 1268, 1269.

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