Method of designing a probe card apparatus with desired...

Details Method of designing a probe card apparatus with desired... Method of designing a probe card apparatus with desired...

2011-08-02

2011-08-02

Nguyen, Ha Tran T (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C439S067000

Reexamination Certificate

active

07990164

ABSTRACT:
A probe card apparatus is configured to have a desired overall amount of compliance. The compliance of the probes of the probe card apparatus is determined, and an additional, predetermined amount of compliance is designed into the probe card apparatus so that the sum of the additional compliance and the compliance of the probes total the overall desired compliance of the probe card apparatus.

REFERENCES:
patent: 5974662 (1999-11-01), Eldridge et al.
patent: 6078186 (2000-06-01), Hembree et al.
patent: 6274823 (2001-08-01), Khandros et al.
patent: 6483328 (2002-11-01), Eldridge et al.
patent: 6530266 (2003-03-01), Adderton et al.
patent: 6579804 (2003-06-01), Zhou et al.
patent: 6720789 (2004-04-01), Audette et al.
patent: 6937037 (2005-08-01), Eldridge et al.
patent: 6965245 (2005-11-01), Kister et al.
patent: 7245137 (2007-07-01), Eldridge et al.
patent: 7385411 (2008-06-01), Eldridge
patent: 1328644 (2001-12-01), None
patent: 1350325 (2002-05-01), None
patent: WO 00/33096 (2000-06-01), None

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