Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2008-01-08
2008-01-08
Tang, Minh N. (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S073100, C324S763010
Reexamination Certificate
active
07317323
ABSTRACT:
The invention relates to a test apparatus for testing semi-conductor components, and to a signal testing procedure, to be used especially during the testing of semi-conductor components. A signal is applied to a connection of a semi-conductor component, a reference signal is applied at a particular voltage level to a further connection of the semi-conductor component, the signal is compared with the reference signal, the voltage level of the reference signal is changed, and the signal is compared with the reference signal.
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Infineon - Technologies AG
Slater & Matsil L.L.P.
Tang Minh N.
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