Defect image classifying method and apparatus and a...

Details Defect image classifying method and apparatus and a... Defect image classifying method and apparatus and a...

2008-04-08

2008-04-08

Le, Brian (Department: 2624)

Image analysis

Applications

Manufacturing or product inspection

C702S035000, C356S237100

Reexamination Certificate

active

07356177

ABSTRACT:
According to the present invention, techniques including a method and apparatus for classifying and displaying images are provided. In an embodiment of the present invention a defect image classification method using inspected objects is provided. The method includes defect images obtained from at least one inspected object. Next a set of defect images is classified into a specified category, which has a feature. The defect images are arranged for display according to the feature and then displayed. The arranging of the defect images may also be based on an evaluation value for each defect image. Another embodiment provides a defect image classification method using inspected objects. Defect images are obtained from at least one inspected object. Next the defect images are classified into a plurality of categories and at least two information items for example, a defect distribution diagram showing locations of defects in the inspected object, information associated with a category of the plurality of categories, and a defect size distribution, are displayed.

REFERENCES:
patent: 5801965 (1998-09-01), Takagi et al.
patent: 5841893 (1998-11-01), Ishikawa et al.
patent: 6483938 (2002-11-01), Hennessey et al.
patent: 7113628 (2006-09-01), Obara et al.

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