Surface scan measuring device and method of forming...

Image analysis – Applications – Manufacturing or product inspection

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C033S503000, C033S551000, C033S555000, C033S556000, C250S559220, C250S559290, C702S168000

Reexamination Certificate

active

07376261

ABSTRACT:
A measuring system includes a coordinate measuring machine for driving a scanning probe and a host computer. The host computer includes a compensation table (53) and a profile analysis unit (54). The compensation table stores, as compensation data, compensation coefficients to correct counter values of a probe counter (415), and compensation radiuses “r” to the workpiece surface concerning central coordinate values of a contact portion, for respective contact directions. The profile analysis unit has a contact direction calculation unit (542), a compensation data selection unit (543), a compensation calculation unit (544). The contact direction calculation unit calculates the contact direction along which the scanning probe comes into contact with a workpiece W, and the compensation data selection unit selects compensation data set up in the compensation table based on thus calculated contact direction.

REFERENCES:
patent: 4991304 (1991-02-01), McMurtry
patent: 5402981 (1995-04-01), McMurtry
patent: 5428548 (1995-06-01), Pilborough et al.
patent: 5778551 (1998-07-01), Herklotz et al.
patent: 5953127 (1999-09-01), Washio et al.
patent: 6543150 (2003-04-01), Matsumiya et al.
patent: 6806968 (2004-10-01), Ruck
patent: 7039550 (2006-05-01), Noda
patent: 7068026 (2006-06-01), Kanematsu
patent: 7100429 (2006-09-01), Matsuki et al.
patent: 2005/0111725 (2005-05-01), Noda et al.
patent: 2005/0263727 (2005-12-01), Noda
patent: H05-256640 (1993-10-01), None
patent: 2003-50118 (2003-02-01), None
WO 00/25087, Calibrations of an Analogue Probe and Error Mapping, Publication Date—May 4, 2000.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Surface scan measuring device and method of forming... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Surface scan measuring device and method of forming..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Surface scan measuring device and method of forming... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2755461

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.