Semiconductor device with a shielding section to prevent...

Semiconductor device manufacturing: process – Making device or circuit emissive of nonelectrical signal – Having diverse electrical device

Reexamination Certificate

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Details

C438S027000, C438S029000, C438S060000, C438S064000, C257S098000, C257S099000, C257S432000, C257S433000, C257SE27129

Reexamination Certificate

active

07863062

ABSTRACT:
In a solid-state imaging device1in which a hollow section9is formed between a solid-state imaging element2and a covering section4and an air path7extending from the hollow section9to the outside is formed in an adhesive section5, a shielding section11for shielding the air path7is formed on the air path7so as to be positioned on a portion exposed from the covering section4. This makes it possible to reduce noises occurring in a signal processing section of a semiconductor element while preventing condensation in the covering section for covering the semiconductor element.

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U.S. Appl. No. 12/155,042, filed on May 29, 2008.

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