Method for checking functional reliability of an image...

Details Method for checking functional reliability of an image... Method for checking functional reliability of an image...

2011-01-18

2011-01-18

Chan, Jason (Department: 2622)

Television

Camera, system and detail

Combined image signal generator and general image signal...

C348S247000, C348S243000, C348S244000, C348S254000, C348S222100, C348S143000

Reexamination Certificate

active

07872678

ABSTRACT:
A method for checking the functional reliability of an image sensor evaluates statistical fluctuations in the grey-scale values provided by the pixels of the image sensor. An actual noise factor, which is derived for light impinging on the pixels, is evaluated. A pixel failure is assumed if the actual noise factor misses a predetermined criterion defined by a reference noise factor. According to one embodiment, the reference noise factor is a dark noise factor. An electronic camera that operates in accordance with the above-described method is also disclosed.

REFERENCES:
patent: 528123 (1894-10-01), Devereux
patent: 779861 (1905-01-01), Maringer
patent: 4602291 (1986-07-01), Temes
patent: 4654714 (1987-03-01), Hurst et al.
patent: 5047861 (1991-09-01), Houchin et al.
patent: 5047863 (1991-09-01), Pape et al.
patent: 5144446 (1992-09-01), Sudo et al.
patent: 5272536 (1993-12-01), Sudo et al.
patent: 5416516 (1995-05-01), Kameyama et al.
patent: 5796430 (1998-08-01), Katoh et al.
patent: 6091492 (2000-07-01), Strickland et al.
patent: 6181830 (2001-01-01), Sato
patent: 6307393 (2001-10-01), Shimura
patent: 6593961 (2003-07-01), Perino
patent: 6618084 (2003-09-01), Rambaldi et al.
patent: 6683643 (2004-01-01), Takayama et al.
patent: 6737625 (2004-05-01), Baharav et al.
patent: 6965410 (2005-11-01), Yamagishi
patent: 7106371 (2006-09-01), Kubo et al.
patent: 7133072 (2006-11-01), Harada
patent: 7301673 (2007-11-01), Kang
patent: 7324143 (2008-01-01), Pelz
patent: 2002/0015111 (2002-02-01), Harada
patent: 2002/0080253 (2002-06-01), Kim
patent: 2002/0176013 (2002-11-01), Itoh
patent: 2002/0196354 (2002-12-01), Chang et al.
patent: 2003/0030723 (2003-02-01), Dottling et al.
patent: 2003/0128285 (2003-07-01), Itoh
patent: 2003/0133027 (2003-07-01), Itoh
patent: 2003/0179418 (2003-09-01), Wengender et al.
patent: 2004/0239782 (2004-12-01), Equitz et al.
patent: 2008/0143855 (2008-06-01), Hussey et al.
patent: 36 32 488 (1987-04-01), None
patent: 40 20 017 (1992-01-01), None
patent: 691 05 815 (1995-04-01), None
patent: 195 27 148 (1997-01-01), None
patent: 100 17 333 (2001-10-01), None
patent: 0 179 252 (1986-04-01), None
patent: 0 458 030 (1991-11-01), None
patent: 0 902 402 (1999-03-01), None
patent: 0 998 138 (2000-05-01), None
patent: 2421654 (2005-11-01), None
patent: 63248289 (1988-10-01), None
patent: 2000209506 (2000-07-01), None
Bosco, A., “Fast method for noise level estimation and integrated noise reduction,” Aug. 2005, IEEE Transactions on Consumer Electronics, vol. 51, pp. 1028-1033.
Chapman, G.H., “On-line identification of faults in fault-tolerant imagers,” Oct. 3-5, 2005, Defect and Fault Tolerance in VLSI Systems, 2005, pp. 149-157.
Jung, C., “Noise analysis of fault tolerant active pixel sensors,” Oct. 3-5, 2005, Defect and Fault Tolerance in VLSI Systems, 2005, pp. 140-148.

Affiliated with

Also associated with

Rating

Method for checking functional reliability of an image... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for checking functional reliability of an image..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for checking functional reliability of an image... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2742288