X-ray or gamma ray systems or devices – Specific application – Absorption
Reexamination Certificate
2011-06-07
2011-06-07
Kiknadze, Irakli (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Absorption
C378S154000, C378S147000
Reexamination Certificate
active
07957505
ABSTRACT:
Arrangements of X-ray inspection systems are described for inspecting high-z materials in voluminous objects such as containers. Inspection methods may involve generating a radiographic image based on detected attenuation corresponding to a pulsed beams of radiation transmitted through a voluminous object. The pulsed beams of radiation are generated by a high-energy source and transmitted substantially downward along an incident angle, of approximately 1° to 30°, to a vertical axis extending through the voluminous object. The generated radiographic image may be analyzed to detect on localized high attenuation representative of high-z materials and to discriminate high-z materials from lower and intermediate-z materials on the basis of the high density and greater attenuation of high-z material for higher energy (3-10 MeV) X-rays, and the compact nature of threatening masses of fissionable materials.
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Katz Jonathan I.
Morris Christopher L.
Durkis James C.
Kiknadze Irakli
Lucas John T.
O'Dwyer Thomas S.
The United States of America as represented by the United States
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