Semiconductor device

Details Semiconductor device Semiconductor device

2011-01-11

2011-01-11

Nguyen, Ha Tran T (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S763010, C324S760020, C324S1540PB, C365S201000, C365S230060, C714S724000, C714S733000

Reexamination Certificate

active

07868641

ABSTRACT:
A semiconductor device with technology for externally deciding if the stress test was performed or not. A semiconductor device includes a stress test circuit and a stress test decision circuit. The stress test circuit outputs control signals for executing the stress test to the stress test decision circuit and the object for testing. The stress test decision circuit then outputs the decision results if the stress test was performed, based on the control signals.

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