Surface inspection method and surface inspection apparatus

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition

Reexamination Certificate

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Reexamination Certificate

active

07872742

ABSTRACT:
A surface inspection apparatus capable of acquiring scattered light intensity distribution information for each scattering azimuth angle, and detecting foreign matters and defects with high sensitivity. A concave mirror for condensation and another concave mirror for image formation are used to cope with a broad cubic angle. Since mirrors for condensation and image formation are used, a support for clamping the periphery of a lens is unnecessary, and an effective aperture area does not decrease. A plurality of azimuth-wise detection optical systems is disposed and reflected light at all azimuths can be detected by burying the entire periphery without calling for specific lens polishing. A light signal unification unit sums digital data from a particular system corresponding to a scattering azimuth designated in advance in the systems for improving an S/N ratio.

REFERENCES:
patent: 5798829 (1998-08-01), Vaez-Iravani
patent: 6512578 (2003-01-01), Komatsu et al.
patent: 63-036135 (1968-02-01), None
patent: 2001-255278 (2001-09-01), None
patent: 2002-062479 (2002-02-01), None
patent: 2002-188999 (2002-07-01), None
patent: 2002-257747 (2002-09-01), None
patent: 2004-177284 (2004-06-01), None
Office Action from Japanese Application No. 2007-235518 dated Jun. 29, 2010.

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