Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate
2011-03-01
2011-03-01
Chowdhury, Tarifur (Department: 2886)
Optics: measuring and testing
By light interference
For dimensional measurement
Reexamination Certificate
active
07898671
ABSTRACT:
An interferometric measuring device for measuring a measured object, in particular for thickness measurement of the measured object. A special-purpose objective having a mirror system is provided, which includes at least one first deflection mirror and one second deflection mirror and in which these are situated in such a way that the object beams incident on the first deflection mirror or on the second deflection mirror are directed respectively onto a first side or a second side, which is parallel thereto, of the measured object to be measured in a first beam path or a second beam path, respectively, which are antiparallel to one another. The mirror system additionally has at least one first position mirror for imaging the position of the measured object to be measured in relation to the first deflection mirror and/or the second deflection mirror.
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T. Dresel et al., “Three-dimensional sensing of rough surfaces by coherence radar,” Appl. Opt. 31 (7), pp. 919-925, 1992.
“Interferometer Measures Both Sides of Disk”; Laser Focus World, Pennewell Publ. Tulsa, Sep. 1997, S.52-53, XP001182916, ISSN:1043-8092.
Chowdhury Tarifur
Hansen Jonathan M
Kenyon & Kenyon LLP
Robert & Bosch GmbH
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