Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching
Reexamination Certificate
2011-07-19
2011-07-19
Norton, Nadine G (Department: 1713)
Semiconductor device manufacturing: process
Chemical etching
Vapor phase etching
C438S706000, C438S710000, C438S711000, C438S712000, C438S724000, C257S369000, C257SE21549
Reexamination Certificate
active
07981806
ABSTRACT:
A method for forming a trench includes providing a substrate, and forming the trench in the substrate using a gas containing chlorine (Cl2) gas as a main etch gas and SiFXgas as an additive gas, wherein a sidewall of the trench has a substantially vertical profile by virtue of reaction of the Cl2gas and the SiFXgas.
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Angadi Maki A
Hynix / Semiconductor Inc.
Lowe Hauptman & Ham & Berner, LLP
Norton Nadine G
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