Controlling a projected pattern

Details Controlling a projected pattern Controlling a projected pattern

2011-03-08

2011-03-08

Pham, Hoa Q (Department: 2886)

Optics: measuring and testing

Shape or surface configuration

Triangulation

C356S614000, C356S004010, C356S005010

Reexamination Certificate

active

07903261

ABSTRACT:
Systems and methods to control projection of a pattern are provided. A particular method includes receiving first three-dimensional coordinates that specify one or more locations on a surface of a workpiece where the one or more locations correspond to a part definition to be projected onto the surface. The method also includes computing scan angles for a scanning system based on the first three-dimensional coordinates. The scan angles specify angles used by the scanning system to direct a beam of light to project the part definition onto the surface. The method also includes sending control signals to the scanning system based on the scan angles.

REFERENCES:
patent: 5864391 (1999-01-01), Hosokawa et al.
patent: 7215413 (2007-05-01), Soreide et al.
patent: 7576871 (2009-08-01), Storm
patent: 7701592 (2010-04-01), Saint Clair et al.
patent: 2002/0054297 (2002-05-01), Lee et al.

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