Crack stop and moisture barrier

Details Crack stop and moisture barrier Crack stop and moisture barrier

2011-08-23

2011-08-23

Nguyen, Ha Tran T (Department: 2829)

Active solid-state devices (e.g., transistors, solid-state diode

Physical configuration of semiconductor

With peripheral feature due to separation of smaller...

C257SE21599, C257SE23194, C438S462000

Reexamination Certificate

active

08004066

ABSTRACT:
A design for a crack stop and moisture barrier for a semiconductor device includes a plurality of discrete conductive features formed at the edge of an integrated circuit proximate a scribe line. The discrete conductive features may comprise a plurality of staggered lines, a plurality of horseshoe-shaped lines, or a combination of both.

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