Reconstruction of x-ray images into basis function...

Details Reconstruction of x-ray images into basis function... Reconstruction of x-ray images into basis function...

2011-01-18

2011-01-18

Bali, Vikkram (Department: 2624)

Image analysis

Applications

Manufacturing or product inspection

Reexamination Certificate

active

07873201

ABSTRACT:
An inspection system that forms material sensitive X-ray images of items under inspection. The images are decomposed into basis function images using basis functions representative of materials of interest. The decomposed images may be processed separately to detect concentrations of a material of interest corresponding to one or more of the basis functions. When operated in this mode, the inspection system may be used in applications such as material sorting or security screening. At least one basis function is selected to distinguish a material of interest from other materials likely contained with the item, allowing one of the basis function images to be analyzed to obtain information about a specific material of interest. The images may be automatically analyzed or may be superimposed for display with different visual characteristics assigned to the components associated with each basis function for analysis by a human operator.

REFERENCES:
patent: 6236709 (2001-05-01), Perry et al.
patent: 6252929 (2001-06-01), Swift et al.
patent: 6463181 (2002-10-01), Duarte
patent: 2004/0101097 (2004-05-01), Wakayama et al.
International Search Report and Written Opinion of the International Searching Authority in Application No. PCT/US05/40713, Sep. 21, 2006.

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