Probe card, semiconductor inspecting apparatus, and...

Details Probe card, semiconductor inspecting apparatus, and... Probe card, semiconductor inspecting apparatus, and...

2011-06-07

2011-06-07

Patel, Paresh (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S754110, C324S756030

Reexamination Certificate

active

07956627

ABSTRACT:
A frame bonded and fixed to a back face of a probe sheet so as to surround a group of pyramid-shaped or truncated pyramid-shaped contact terminals collectively formed at a central region portion of the probe sheet on a probing side thereof is protruded from a multi-layered wiring board, and pressing force is imparted to the frame and a pressing piece at a central portion by a plurality of guide pins having spring property so as to tilt finely.

REFERENCES:
patent: 4906920 (1990-03-01), Huff et al.
patent: 5339027 (1994-08-01), Woith et al.
patent: 5412866 (1995-05-01), Woith et al.
patent: 5422574 (1995-06-01), Kister
patent: 5604446 (1997-02-01), Sano
patent: 5642056 (1997-06-01), Nakajima et al.
patent: 5672977 (1997-09-01), Yamada
patent: 5804983 (1998-09-01), Nakajima et al.
patent: 5825192 (1998-10-01), Hagihara
patent: 5974662 (1999-11-01), Eldridge et al.
patent: 6060891 (2000-05-01), Hembree et al.
patent: 6952110 (2005-10-01), Kohno et al.
patent: 7049837 (2006-05-01), Kasukabe et al.
patent: 7420380 (2008-09-01), Kasukabe et al.
patent: 7776626 (2010-08-01), Hasebe et al.
patent: 2006/0192575 (2006-08-01), Kasukabe et al.
patent: 2007/0159192 (2007-07-01), Hasegawa et al.
patent: 1512186 (2004-07-01), None
patent: 02-163664 (1990-06-01), None
patent: 2001-159643 (2001-06-01), None
patent: 2005-024377 (2005-01-01), None
patent: 2006/097982 (2006-09-01), None
ITC (International Test Conference) of 1998, pp. 601-607.

Affiliated with

Also associated with

Rating

Probe card, semiconductor inspecting apparatus, and... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Probe card, semiconductor inspecting apparatus, and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Probe card, semiconductor inspecting apparatus, and... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2716069