Methods and apparatus for testing of high dielectric capacitors

Details Methods and apparatus for testing of high dielectric capacitors Methods and apparatus for testing of high dielectric capacitors

2011-08-23

2011-08-23

He, Amy (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S522000, C324S750030

Reexamination Certificate

active

08004288

ABSTRACT:
The present subject matter provides apparatus and methods for testing high dielectric capacitors. A testing process whereby voltage and temperature is varied to provide temperature dependent plots to determine the reliability of a capacitor is provided. A testing system is demonstrated to measure capacitor reliability and/or relative capacitor reliability.

REFERENCES:
patent: 5510719 (1996-04-01), Yamamoto
patent: 5677634 (1997-10-01), Cooke et al.
patent: 6476617 (2002-11-01), Kawaguchi et al.
patent: 7540885 (2009-06-01), Kamitani

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