Test apparatus and transmission apparatus

Details Test apparatus and transmission apparatus Test apparatus and transmission apparatus

2011-05-17

2011-05-17

Tang, Minh N (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S756060, C324S762010, C324S073100

Reexamination Certificate

active

07944226

ABSTRACT:
A test apparatus for testing a device under test includes a test signal generating section that generates a test signal to be supplied to the device under test, a main driving section that outputs an output voltage determined in accordance with the test signal, to an input/output pin connected to a signal input/output terminal of the device under test, a replica driving section that outputs a comparison voltage determined in accordance with the test signal, a resistance voltage dividing section that generates a divided voltage by resistance-dividing the comparison voltage, a comparing section that compares a voltage of the input/output pin with the divided voltage, a judging section that judges acceptability of the device under test based on a result of the comparison by the comparing section, and an adjusting section that adjusts a voltage dividing ratio of the resistance voltage dividing section so that the divided voltage becomes equal to a voltage obtained by adding together a predetermined threshold voltage and a voltage of the input/output pin that is observed when the main driving section has output the output voltage and the signal input/output terminal of the device under test has not output a response signal.

REFERENCES:
patent: 6133725 (2000-10-01), Bowhers
patent: 6275023 (2001-08-01), Oosaki et al.
patent: 6956393 (2005-10-01), Tanaka
patent: 7373574 (2008-05-01), Kojima
patent: 2006/0010360 (2006-01-01), Kojima
patent: 2002-507754 (2002-03-01), None
patent: 2006-23233 (2006-01-01), None
International Search Report (ISR) issued in PCT/JP2008/062354 (parent application) for Examiner consideration, citing U.S. Patents Nos. 1-2, and Foreign Patent Document Nos. 1-2 listed above.
Written Opinion (PCT/ISA/237) issued in PCT/JP2008/062354 (parent application).

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