Semiconductor package through-electrode suitable for a...

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified configuration

Reexamination Certificate

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C257SE23145

Reexamination Certificate

active

07973414

ABSTRACT:
A semiconductor package including a through-electrode for stacked a semiconductor package and a semiconductor package having the same is disclosed. The semiconductor package through-electrode includes a first electrode having a recessed portion formed therein to pass through a semiconductor chip. A second electrode is disposed within the recess of the first electrode. The first electrode of the semiconductor package through-electrode includes a first metal having a first hardness, and a second electrode comprises a second metal having a second hardness lower than the first hardness. The through-electrode passes through the semiconductor chip body and may be formed with the first metal having the first hardness and/or a first melting point and the second metal having the second hardness and/or a second melting point which are lower than the first hardness and/or the first melting point. This through-electrode allows a plurality of semiconductor packages to be easily stacked.

REFERENCES:
patent: 6897148 (2005-05-01), Halahan et al.
patent: 7176128 (2007-02-01), Ahrens et al.
patent: 7521360 (2009-04-01), Halahan et al.
patent: 7781892 (2010-08-01), Chen et al.
patent: 2002/0084513 (2002-07-01), Siniaguine
patent: 1655333 (2005-08-01), None
patent: 2001-135785 (2001-05-01), None
patent: 1020050021078 (2005-03-01), None
patent: 1020050122532 (2005-12-01), None
patent: 1020070051165 (2007-05-01), None

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