System for estimating and improving test case generation

Details System for estimating and improving test case generation System for estimating and improving test case generation

2011-03-08

2011-03-08

Charioui, Mohamed (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C702S120000, C702S122000, C702S182000

Reexamination Certificate

active

07904270

ABSTRACT:
A technique for estimating and improving the test coverage for large machines, while accumulating minimum information of past test cases (i.e., minimum feedback) is provided. The technique is scalable in the sense that the number of machine instructions needed to measure the test coverage can range from a few instructions to all the instructions. The technique is easily integrated into existing test generation systems and is applicable to both uni- and multi-processing systems.

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