Defect review and classification system

Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C382S149000, C382S224000, C702S183000

Reexamination Certificate

active

07925367

ABSTRACT:
The invention proposes a system that interrupts a processing associated with an ADC having low priority when an ADC processing cannot catch up with ADR by an ADC alone that is not under execution but uses an ADC for an ADR having high priority. To preferentially execute ADR/ADC having high priority, the invention employs an algorithm for serially selecting ADR/ADC in the order of higher processing capacity (in the order of greater numerical values in the expression by a DPH unit) from among ADR/ADCs that have the lowest priority, no matter whether the ADR/DC is now under execution or not.

REFERENCES:
patent: 5544256 (1996-08-01), Brecher et al.
patent: 6177287 (2001-01-01), Steffan et al.
patent: 6185511 (2001-02-01), Steffan et al.
patent: 6259960 (2001-07-01), Inokuchi
patent: 6408219 (2002-06-01), Lamey et al.
patent: 6438438 (2002-08-01), Takagi et al.
patent: 6456899 (2002-09-01), Gleason et al.
patent: 6483938 (2002-11-01), Hennessey et al.
patent: 6519357 (2003-02-01), Takeuchi
patent: 6542830 (2003-04-01), Mizuno et al.
patent: 6922482 (2005-07-01), Ben-Porath
patent: 7034298 (2006-04-01), Miyai et al.
patent: 7062081 (2006-06-01), Shimoda et al.
patent: 7113628 (2006-09-01), Obara et al.
patent: 7584012 (2009-09-01), Hirai et al.
patent: 7664562 (2010-02-01), Hirai et al.
patent: 2002/0181757 (2002-12-01), Takeuchi
patent: 2004/0188609 (2004-09-01), Miyai et al.
patent: 2004/0234120 (2004-11-01), Honda et al.
patent: 2001-127129 (2001-05-01), None
patent: 2002-310962 (2002-10-01), None
patent: 2004-294360 (2004-10-01), None
Apr. 14, 2008 Office Action issued in U.S. Appl. No. 11/892,583.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Defect review and classification system does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Defect review and classification system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Defect review and classification system will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2686208

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.