Probe assembly

Details Probe assembly Probe assembly

2011-05-24

2011-05-24

Hollington, Jermele M (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07948253

ABSTRACT:
An inexpensive probe assembly is provided which is applicable to narrow pad arrangements of LSI circuit designs, while closely-arranged wiring patterns near probe terminals is distributed effectively on an inspection substrate. A probe assembly is provided which is fabricated by etching metallic foil adhering to a resin film to form a conductive pattern including probing function on the resin film, and stacking or parallel-arranging a plurality of the resin films with probing function, the probe assembly used for inspecting circuits on a semiconductor chip by making probe tips collectively contact electrode pads on the chip, characterized in that the probe assembly includes an electrical terminal which is connected to the probe via the conductive pattern and is made to contact with a connecting land of the circuit board at an opposite side in a first direction (vertical direction) on the same plane as the probe.

REFERENCES:
patent: 7622937 (2009-11-01), Kimoto
patent: 2001-183392 (2001-07-01), None
patent: 2004-340654 (2004-12-01), None
patent: 2006-003191 (2006-01-01), None

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