Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2011-08-23
2011-08-23
Nguyen, Vinh P (Department: 2858)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S750300
Reexamination Certificate
active
08004302
ABSTRACT:
A semiconductor device whose operational state is switched between a test state and a normal operational state according to a logical value of a signal input from the outside is provided. The semiconductor device includes a first power line, a second power line, a switch that is controlled by a signal line to couple/isolate the first power line to/from the second power line, a control circuit that outputs a control signal, and a state switching circuit that drives the signal line to couple/isolate the first power line to/from the second power line according to a logical value of the control signal when the input signal is one of logical values, whereas the state switching circuit drives the signal line to couple the first power line to the second power line when the first signal is the other logical value.
REFERENCES:
patent: 6894520 (2005-05-01), Yamashita et al.
patent: 6900628 (2005-05-01), Shirahama et al.
patent: 2008/0296977 (2008-12-01), Kawasaki
patent: 10-021699 (1998-01-01), None
patent: 2003-098223 (2003-04-01), None
Arent & Fox LLP
Fujitsu Limited
Nguyen Vinh P
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