Method of forming a small contact in phase-change memory

Semiconductor device manufacturing: process – Having selenium or tellurium elemental semiconductor component

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S004000, C257SE21068, C257SE45001

Reexamination Certificate

active

07901979

ABSTRACT:
A method of fabricating a phase-change memory cell is described. The cross-sectional area of a contact with a phase-change memory element within the cell is controlled by a width and an exposed length of a bottom electrode. The method allows the formation of very small phase-change memory cells.

REFERENCES:
patent: 4115872 (1978-09-01), Bluhm
patent: 6514788 (2003-02-01), Quinn
patent: 6569705 (2003-05-01), Chiang et al.
patent: 6579760 (2003-06-01), Lung
patent: 6597009 (2003-07-01), Wicker
patent: 6764894 (2004-07-01), Lowrey
patent: 6777705 (2004-08-01), Reinberg et al.
patent: 7012273 (2006-03-01), Chen
patent: 2002/0080647 (2002-06-01), Chiang et al.
patent: 2003/0073262 (2003-04-01), Xu et al.
patent: 2004/0202033 (2004-10-01), Lowrey
patent: 2005/0020021 (2005-01-01), Fujiwara et al.
patent: 2006/0006374 (2006-01-01), Chang
patent: 1449021 (2003-10-01), None
English Abstract of CN1449021.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of forming a small contact in phase-change memory does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of forming a small contact in phase-change memory, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of forming a small contact in phase-change memory will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2671041

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.