Data processing: speech signal processing – linguistics – language – Speech signal processing – Recognition
Reexamination Certificate
2011-03-22
2011-03-22
Opsasnick, Michael N (Department: 2626)
Data processing: speech signal processing, linguistics, language
Speech signal processing
Recognition
Reexamination Certificate
active
07912715
ABSTRACT:
A method for determining a set of distortion measures in a pattern recognition process, where a sequence of feature vectors is formed from a digitized incoming signal to be recognized, said pattern recognition being based upon said set of distortion measures. The method comprises comparing (S10) a first feature vector in said sequence with a first number (M1) of templates from a set of templates representing candidate patterns, based on said comparison, selecting (S12) a second number (M2) of templates from said template set, the second number being smaller than the first number, and comparing (S14) a second feature vector only with said selected templates. The method can be implemented in a device for pattern recognition.
REFERENCES:
patent: 4941178 (1990-07-01), Chuang
patent: 5148489 (1992-09-01), Erell et al.
patent: 5475792 (1995-12-01), Stanford et al.
patent: 5515475 (1996-05-01), Gupta et al.
patent: 5933806 (1999-08-01), Beyerlein et al.
patent: 6009390 (1999-12-01), Gupta et al.
patent: 6070140 (2000-05-01), Tran
patent: 6161091 (2000-12-01), Akamine et al.
patent: 6195639 (2001-02-01), Feltstrom et al.
patent: 0903728 (1999-03-01), None
“Two-Stage Computational Cost Reduction Algorithm Based on Mahalanobis Distance Approximations,” by F. Sun, S. Omachi, N. Kato, H. Aso, S. Kono and T. Takagi, IEEE, Sep. 2000, vol. 2.
“Fast Decoding Techniques for Practical Real-Time Speech Recognition Systems,” by J. Suontausta, J. Hakkinen and O. Viikki.
“Fast Likelihood Computation Methods for Continuous Mixture Densities in Large Vocabulary Speech Recognition,” by S. Ortmanns, T. Firzlaff and H. Ney.
“Vector Quantization for the Efficient Computation of Continuous Density Likelihoods,” by E. Bocchieri, IEEE, 1993.
Fressola Alfred A.
Nokia Corporation
Opsasnick Michael N
Ware Fressola Van Der Sluys & Adolphson LLP
LandOfFree
Determining distortion measures in a pattern recognition... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Determining distortion measures in a pattern recognition..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Determining distortion measures in a pattern recognition... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2669833