Optics: measuring and testing – By polarized light examination – With birefringent element
Reexamination Certificate
2011-05-24
2011-05-24
Lauchman, L. G (Department: 2877)
Optics: measuring and testing
By polarized light examination
With birefringent element
C349S096000, C349S061000
Reexamination Certificate
active
07948623
ABSTRACT:
A method of evaluating a color filter including a substrate, and at least three color pixels disposed thereon, the method includes determining an oblique visibility of a liquid crystal display device equipped with the color filter on the basis of value ξ1obtained from the equation (1):in-line-formulae description="In-line Formulae" end="lead"?ξ1=∫abΔ(λ)·T(λ)dλ (1)in-line-formulae description="In-line Formulae" end="tail"?wherein “a” and “b” are values respectively representing a wavelength range of a continuous wavelength light and satisfying conditions of 380≦a, b≦780 and a<b; Δ(λ) represents an optical retardation obtained by irradiating each of color pixels with a continuous wavelength light containing light components with wavelength λ falling within a range of 380 nm to 780 nm at an incident angle, and subjecting the transmitted light to measurement using a spectroscopic ellipsometer, and T(λ) represents a spectral transmittance of the color pixels measured at the wavelength λ falling within a range of 380 nm-780 nm.
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Japanese Office Action issued Mar. 22, 2011 in corresponding Japanese Patent Application 2006-341842.
Akao Sosuke
Hagiwara Hidesato
Itoi Takeshi
Minato Koichi
Saito Yuki
Lauchman L. G
Tokyo Ink Mfg. Co., Ltd.
Toppan Printing Co. Ltd.
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